JZT-2000 Handheld Alloy Analysis Spectrometer
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Description
Product Introduction:
The spectrometer employs the internationally recognized software algorithm known as the Fundamental Parameters (FP) method. After nearly a decade of development and refinement, the software not only offers comprehensive functionality but also boasts robust capabilities for education, research, and scientific development.
Product Advantages
1. It employs a high-performance Si-Pin detector, offering enhanced detection accuracy.
2. Enables on-site, rapid, non-destructive, and accurate analysis, displaying alloy grade, elemental composition, and percentage content within 2–3 seconds.
3. The use of a 50 kV, 100 mA, 4 W X-ray tube enables the instrument to achieve both improved detection limits and enhanced radiation safety.
4. With the Smart Beam technology, Ti and V can be analyzed with an accuracy of up to 0.02%, enabling precise differentiation between stainless steel grades 304 and 321, chromium alloys P91 and 9Cr, titanium alloy Grade 7 titanium and pure titanium, and more.
5. A lower detector temperature—operating at an ultra‑low temperature of −35°C—endows the instrument with exceptional resolution.
6. Higher measurement accuracy: the averaging function for multiple measurements can effectively enhance the instrument’s precision.
7. Intelligent detection of irregular or extremely small samples—such as a hair strand (0.06 mm) thick—can be tested and identified instantly.
8. Automatic stop function: if no object is detected in front of the measurement window, the instrument will automatically cease testing after 2 seconds.
9. The extendable probe enables inspection of hard-to-reach areas, such as pipe inner walls, welds, and small components.
10. The instrument features a built-in high-definition display screen, allowing users to freely specify, view, and edit test information and results on-site.
11. No computer is required; alloy grades can be added, edited, or deleted on-site.
12. The instrument is constructed from aluminum alloy, offering superior heat dissipation, enhanced vibration resistance, and an automatic radiation‑protection safety device.
13. Featuring a user-friendly one-touch button design, users no longer need to hold the button down throughout the testing process.
14. Test results can be connected to a computer for output and printing, and the instrument features a standard test‑result format, greatly facilitating customers’ editing and printing of result information.
15. The instrument supports remote monitoring, enabling maintenance engineers to remotely install software and perform troubleshooting over the internet, ensuring 24/7 uptime for the customer’s equipment.
16. The instrument employs the Windows CE operating system, ensuring greater stability and enhanced functionality.
17. The instrument is equipped with a standard block; each time it is powered on, it automatically performs a calibration. Only after successful calibration can the instrument be used normally. If the calibration fails, the instrument must not be operated, ensuring that it always operates within its specified accuracy range.
18. The instrument employs the fundamental parameter method (FP Method), eliminating the need to identify the sample type or select a calibration curve prior to analysis.
19. Test results can be exported to Excel, transferred directly to a personal computer via Bluetooth, or printed and archived on a laptop.
Technical Specifications:
| Project | Details |
| Weight | Approximately 1.4 kg; with battery installed: 1.5 kg. |
| Dimensions (Height x Width x Length) | 300mm × 90mm × 220mm |
| Excitation source | X-ray tube target materials: four options—gold (Au), silver (Ag), tungsten (W), and palladium (Pd). |
| Voltage, Current, and Power | High-Power Miniature X-Ray Tube, 50 kV, 100 mA, 4 W |
| Filter | Six selectable filters automatically adjust according to the specific object. |
| probe | High-performance, high-resolution Si-Pin X-ray detector |
| Detector cooling temperature | Peltier-effect semiconductor cooling, cooling temperature: -35°C |
| Standard sheet | External 316 standard cap with test window protection feature |
| Resolution | < 180ev |
| Power supply | 8 hours / 2 lithium batteries and AC power supply |
| Processor | Intel 400MHz StrongARM processor |
| Operating system | Mobile Windows CE System |
| Compatibility | Bluetooth |
| Software Standard Mode | Alloy |
| Data processing | 8G high-capacity data storage card: ≥40,000 sets of data and spectra |
| Data analysis | Multiple analysis modes, including basic parameters, Compton normalization, and empirical calibration mode. |
| Data shows | Focus on ppm and percentage (%) display, spectral or peak intensity (count rate), or user-defined units. |
| Data transmission | RS232 serial cable, Bluetooth, Excel output |
| Display screen | Color, high-resolution 3.5-inch TFT industrial-grade touchscreen, large-icon graphical interface, clearly visible under any lighting conditions. |
| Safe Operation | One‑click “trigger” function: the software automatically locks the trigger on a timer or automatically stops the test, with protective‑function monitoring; if no sample is present in front of the test window, the X‑ray beam shuts off automatically within 2 seconds. |
| Analysis element | It can analyze all elements from Mn (manganese) to U (uranium). The standard configuration includes the following elements: Cr—chromium, Mn—manganese, Fe—iron, Ni—nickel, Cu—copper, Zn—zinc, Pb—lead, Se—selenium, Zr—zirconium, Co—cobalt, V—vanadium, Mo—molybdenum, Ag—silver, Cd—cadmium, Sn—tin, Sb—antimony, Ti—titanium, Hf—hafnium, Ta—tantalum, W—tungsten, Re—rhenium, Pd—palladium, Au—gold, Pt—platinum, Rh—rhodium, Ru—ruthenium, Nb—niobium, Bi—bismuth, and others. |
| Test Environment Conditions | Temperature: -20 to +50°C, Humidity: < 80% RH |
| Radiation protection function | The radiation dose rate at the instrument handle and within a 10–100 cm space from the instrument housing is less than 2.5 μSv/h. |
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