LBT-200M Upright High-Resolution Precision Metallographic Microscope
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Description
Product Introduction:
It employs a plan‑field apochromatic optical system and an epi‑fluorescence Köhler illumination system, with an anti‑reflection structure incorporated into the epi‑illumination setup to effectively suppress reflected light that could interfere with the imaging beam, resulting in sharper images and superior field contrast. A stable, reliable operating mechanism ensures clearer imaging and simpler handling. The microscope body features a completely new ergonomic design, with a balanced, well‑proportioned structure that enables modular expansion. Low‑position controls for the stage, brightness adjustment, and coarse/fine focus enhance user comfort. It is widely used in semiconductor silicon wafer inspection, materials science research, geological and mineralogical analysis, precision engineering, and other disciplines.
High-eyepoint, wide-field, planar eyepiece
LBT-200M The series is widely used in educational settings, typically equipped with a high‑eye‑point, wide‑field, plan‑achromatic eyepiece PL10X/18mm; other magnifications and fields of view are also available. Additionally, depending on specific requirements, it can be fitted with reticles, micrometer scales, and adjustable diopter compensation.
Compact and innovative structural design
A stable, rectangular base; a two-piece, detachable arm and stage; and, during high-magnification observation, a vibration-free image plane ensure the delivery of steady, high‑quality microscopic images. A variety of illumination systems are available.
Powerful extensibility
In addition to conventional metallography, it can be expanded into various types of microscopes, including fluorescence, digital, metallographic, and polarizing microscopes, and supports observation modes such as brightfield, darkfield, fluorescence, simple polarization, and phase contrast.
Software Introduction:
The metallographic analysis software was developed by materials science experts in our unit’s Software Department. It currently includes approximately 500 metallographic microstructure modules, covering most of the standard metallographic inspection procedures. For details, please refer to the Metallography Module Catalog. The “Professional Quantitative Metallographic Image Analysis Computer Operating System” configured within the metallographic image analysis system processes acquired sample images and performs real-time comparison, inspection, grading, analysis, statistical evaluation, and generation of graphical and textual reports. The software integrates cutting-edge image analysis technologies, enabling a seamless integration of metallographic microscopy with intelligent analytical capabilities. The system delivers rapid and accurate measurement and assessment results that comply with national standards (GB) and other relevant industry standards (JB). / YB / HB / Quality Control / DL / DJ / (ASTM, etc.). The system features a bilingual Chinese–English interface that is both concise and easy to use; with minimal training or by referring to the user manual, operators can master its functions with ease. It also provides a quick and efficient way to learn metallographic fundamentals and to promote widespread proficiency in operating the equipment.
Features:
1. Image editing software: offers more than ten functions, including image acquisition and image storage;
2. Image software: more than ten functions, including image enhancement and image overlay;
3. Image measurement software: dozens of measurement functions, including perimeter, area, and percentage content;
4. Grain Size Measurement and Grading (grain boundary extraction, grain boundary reconstruction, single-phase, dual-phase, grain size measurement, grading);
5. Measurement and rating of non-metallic inclusions (including sulfides, oxides, silicates, etc.);
6. Measurement and grading of pearlite and ferrite content; measurement and grading of graphite spheroidization rate in ductile cast iron;
7. Measurement of decarburized and carburized layers, and measurement of surface coating thickness;
8. Weld Penetration Measurement
9. Measurement of the area fraction of phases in ferritic and austenitic stainless steels;
10. Includes metallographic charts for nearly 470 commonly used metallic materials, meeting the requirements of metallographic analysis and inspection in the vast majority of institutions.
11. In view of the continuous increase in new materials and imported-grade materials, materials and assessment criteria that have not yet been entered into the software can be customized and added.
Technical Specifications:
| Name | Specification |
| Structure | 30° tilt, hinged trinocular head, 360° rotation |
| Magnification factor | 50× to 500×. |
| Objective lens | Infinity-corrected apochromatic objectives: 5×, 10×, 20×, 50× |
| Eyepiece | High‑eye‑point, wide‑field, plan‑achromatic eyepiece PL10X/18mm. |
| Micrometer | The scale value is 0.01 mm/1 mm. |
| Stage | 140 mm × 132 mm double-layer composite mechanical stage, travel range: 76 mm × 50 mm, accuracy 0.1 mm |
| Focusing mechanism | Low‑position coaxial coarse‑and‑fine focus mechanism. Coarse adjustment travel: 28 mm; fine adjustment accuracy: 0.002 mm; equipped with a tension‑adjustment lock to prevent downward drift and an upper‑limit stop to protect the specimen slide from damage. Condenser with an adjustable centering bracket. |
| Lighting system | Adaptive wide voltage range of 100V–240V, with an integrated switching power supply and continuously adjustable brightness, ensures long‑term reliability. Equipped with a preset 6V 20W halogen lamp at the center, featuring fixed‑position Köhler illumination. |
| Optical system | Infinity-corrected optical system. |
| Power supply | 220VAC (50Hz) |
| Metallographic Analysis Software | JX2018 Version of the Automated Metallographic Analysis System |
| 3-megapixel camera | |
| 0.5X adapter lens | |
| Micrometer scale (accuracy: 0.01 mm) |
Standard Equipment List
| Number | Name | Quantity | Note |
| 1 | Host | 1 | |
| 2 | Eyepiece observation head | 1 | |
| 3 | 10X Plan-Eyepiece | 2 | |
| 4 | 5X objective lens | 1 | |
| 5 | 10X objective lens | 1 | |
| 6 | 20X objective lens | 1 | |
| 7 | 50X objective lens | 1 | |
| 8 | Elastic clip | 1 | |
| 9 | Stage plate | 1 | |
| 10 | LED light box | 1 | |
| 11 | 0.5X adapter lens | 1 | |
| 12 | Metallographic Analysis Software System | 1 | |
| 13 | Imaging device | 1 | |
| 14 | 0.01/1mm scale | 1 | |
| 15 | Power cord | 1 |
Personalized Shopping
| Eyepiece | □12.5X□20X□10X differential eyepiece |
| Objective lens |
□40X □60X □80X □100X |
| Software | □ English-language software □ 5-megapixel camera □ 12-megapixel camera |
| Related equipment | □Metallographic Grinding and Polishing Machine□Metallographic Cutting Machine□Metallographic Mounting□Hardness Tester |
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LBT-200M Upright High-Resolution Precision Metallographic Microscope
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